CompactVerbose
HDMI Test Report
Overall Results:0 of 13
Tests Failed
| Test Configuration Details |
| Device Description |
| Device ID | Transmitter |
| Test Fixture Type | N1080A / SMA Probe |
| Jitter Separation Measurement | OFF |
| Connection Type | 2 Connections |
| Test Session Details |
| Infiniium SW Version | 05.10.0000
|
| Infiniium Model Number | DSO81204B |
| Infiniium Serial Number | No Serial |
| Last Test Date | 12/7/2006 8:07:20 PM |
Summary of Results
|
| Warning | <
2
% |
| Critical | <
0
% |
Report Detail
Test Summary:
Pass
Test Description:
TMDS differential clock jitter must not exceed 0.25*Tbit, relative to the ideal Recovery Clock. For compliance, the DUT should output all the required pixel clock frequency for all the test.
Test Limits:VALUE <= 250mTbitClock Jitter (worst of 3)99mTbitResult Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Test Frequency(MHz) | # Edges | Tbit(ps) | Clock Jitter(ps) |
 | Trial 1 | 99mTbit | 60.4 | 148.347 | 16.00000M | 674.094 | 66.650 |
 | Trial 2 | 89mTbit | 64.4 | 148.513 | 16.00000M | 673.342 | 59.910 |
 | Trial 3 | 97mTbit | 61.2 | 148.391 | 16.00000M | 673.897 | 65.150 |
Clock Jitter
Trial 1: Clock Jitter
Trial 2: Clock Jitter
Trial 3: Clock Jitter
Test Summary:
Pass
Test Description:
For all channels under all operating conditions specified in
Table 4-11 . The Source shall have output levels at TP1, which
meet the normalized eye diagram requirements.
Test Limits:Zero Mask Failures# Mask Failures (worst of 3)0.000Result Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Maximum Margin | Data Lane A | Test Frequency(MHz) | Mask Moved(ps) | # Acquisitions Point | Tbit(ps) | RightJitterData(Tbit) | LeftJitterData(Tbit) | RightJitterData(ps) | LeftJitterData(ps) | Differential Swing Voltage(mV) |
 | Trial 1 | 0.000 | N/A
| 0.000000s | D0 | 148.347 | 0.000 | 16.00000M | 673.417 | 145m | 145m | 97.500 | 97.500 | 800.000 |
 | Trial 2 | 0.000 | N/A
| 0.000000s | D0 | 148.513 | 0.000 | 16.00000M | 673.381 | 138m | 138m | 93.000 | 93.000 | 800.000 |
 | Trial 3 | 0.000 | N/A
| 0.000000s | D0 | 148.391 | 0.000 | 16.00000M | 673.414 | 143m | 145m | 96.000 | 97.500 | 800.000 |
| Mean | 0.000 | | 0.000 | | | | | | | | | | |
| StDev | 0.000 | | 0.000 | | | | | | | | | | |
| Range | 0.000 | | 0.000 | | | | | | | | | | |
| Min | 0.000 | | 0.000 | | | | | | | | | | |
| Max | 0.000 | | 0.000 | | | | | | | | | | |
# Mask Failures
Trial 1: # Mask Failures
Trial 2: # Mask Failures
Trial 3: # Mask Failures
Test Summary:
Pass
Test Description:
For all channels under all operating conditions specified in
Table 4-11 . The Source shall have output levels at TP1, which
meet the normalized eye diagram requirements.
Test Limits:<=0.3TbitTbitCheck (worst of 3)145mResult Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Data Lane A | Test Frequency(MHz) | Mask Moved(ps) | # Acquisitions Point | Tbit(ps) | RightJitterData(Tbit) | LeftJitterData(Tbit) | RightJitterData(ps) | LeftJitterData(ps) | Differential Swing Voltage(mV) |
 | Trial 1 | 145m | 51.7 | D0 | 148.347 | 0.000 | 16.00000M | 673.417 | 145m | 145m | 97.500 | 97.500 | 800.000 |
 | Trial 2 | 138m | 54.0 | D0 | 148.513 | 0.000 | 16.00000M | 673.381 | 138m | 138m | 93.000 | 93.000 | 800.000 |
 | Trial 3 | 145m | 51.7 | D0 | 148.391 | 0.000 | 16.00000M | 673.414 | 143m | 145m | 96.000 | 97.500 | 800.000 |
TbitCheck
Trial 1: TbitCheck
Trial 2: TbitCheck
Trial 3: TbitCheck
Test Summary:
Pass
Test Description:
The transition time is defined as the time interval between the normalized 20% and 80% amplitude levels. For compliance, the DUT should output the highest supported pixel clock frequency during the test.
Test Limits:VALUE >= 75.000psRaw clock transition time (worst of 3)84.850psResult Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Test Frequency(MHz) | Upper Threshold(%) | Lower Threshold(%) | # Edges |
 | Trial 1 | 85.070ps | 13.4 | 148.347 | 80.000 | 20.000 | 7.610000k |
 | Trial 2 | 84.850ps | 13.1 | 148.513 | 80.000 | 20.000 | 7.610000k |
 | Trial 3 | 85.820ps | 14.4 | 148.391 | 80.000 | 20.000 | 7.610000k |
Raw clock transition time
Trial 1: Raw clock transition time
Trial 2: Raw clock transition time
Trial 3: Raw clock transition time
Test Summary:
Pass
Test Description:
The transition time is defined as the time interval between the normalized 20% and 80% amplitude levels. For compliance, the DUT should output the highest supported pixel clock frequency during the test.
Test Limits:VALUE >= 75.000psRaw clock transition time (worst of 3)83.710psResult Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Test Frequency(MHz) | Upper Threshold(%) | Lower Threshold(%) | # Edges |
 | Trial 1 | 83.710ps | 11.6 | 148.347 | 80.000 | 20.000 | 7.610000k |
 | Trial 2 | 84.790ps | 13.1 | 148.513 | 80.000 | 20.000 | 7.610000k |
 | Trial 3 | 84.010ps | 12.0 | 148.391 | 80.000 | 20.000 | 7.610000k |
Raw clock transition time
Trial 1: Raw clock transition time
Trial 2: Raw clock transition time
Trial 3: Raw clock transition time
Test Summary:
Pass
Test Description:
The transition time is defined as the time interval between the normalized 20% and 80% amplitude levels. For compliance, the DUT should output the highest supported pixel clock frequency during the test.
Test Limits:VALUE >= 75.000psTransition Time (worst of 3)90.041psResult Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Test Frequency(MHz) | Data Lane A | Upper Threshold(%) | Lower Threshold(%) | #Edge |
 | Trial 1 | 90.041ps | 20.1 | 148.347 | D0 | 80.000 | 20.000 | 1.000000k |
 | Trial 2 | 93.760ps | 25.0 | 148.513 | D0 | 80.000 | 20.000 | 1.000000k |
 | Trial 3 | 91.788ps | 22.4 | 148.391 | D0 | 80.000 | 20.000 | 1.000000k |
Histogram
Trial 1: Histogram
Trial 2: Histogram
Trial 3: Histogram
Transition Time
Trial 1: Transition Time
Trial 2: Transition Time
Trial 3: Transition Time
Test Summary:
Pass
Test Description:
The transition time is defined as the time interval between the normalized 20% and 80% amplitude levels. For compliance, the DUT should output the highest supported pixel clock frequency during the test.
Test Limits:VALUE >= 75.000psTransition Time (worst of 3)99.383psResult Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Test Frequency(MHz) | Data Lane A | Upper Threshold(%) | Lower Threshold(%) | #Edge |
 | Trial 1 | 99.383ps | 32.5 | 148.347 | D0 | 80.000 | 20.000 | 1.000000k |
 | Trial 2 | 103.200ps | 37.6 | 148.513 | D0 | 80.000 | 20.000 | 1.000000k |
 | Trial 3 | 103.100ps | 37.5 | 148.391 | D0 | 80.000 | 20.000 | 1.000000k |
Histogram
Trial 1: Histogram
Trial 2: Histogram
Trial 3: Histogram
Transition Time
Trial 1: Transition Time
Trial 2: Transition Time
Trial 3: Transition Time
Test Summary:
Pass
Test Description:
TMDS overshoot must be below 15% of 2*VSWING. For compliance, the DUT should output the lowest supported pixel clock frequency during the test.
Test Limits:<=15%Overshoot (worst of 3)6.267Result Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Test Frequency(MHz) | # Edges | Differential Swing Voltage(mV) | VH(mV) | VL(mV) | VH+(mV) | VH+(%) | VL-(mV) | VL-(%) |
 | Trial 1 | 6.267 | 58.2 | 148.347 | 1.000000k | 750.000 | 380.000 | -370.000 | 44.000 | 5.867 | 47.000 | 6.267 |
 | Trial 2 | 5.459 | 63.6 | 148.513 | 1.000000k | 751.000 | 380.000 | -371.000 | 41.000 | 5.459 | 36.000 | 4.794 |
 | Trial 3 | 5.578 | 62.8 | 148.391 | 1.000000k | 753.000 | 383.000 | -370.000 | 39.000 | 5.179 | 42.000 | 5.578 |
VH, VH+, VH-
Trial 1: VH, VH+, VH-
Trial 2: VH, VH+, VH-
Trial 3: VH, VH+, VH-
VL, VL+, VL-
Trial 1: VL, VL+, VL-
Trial 2: VL, VL+, VL-
Trial 3: VL, VL+, VL-
Test Summary:
Pass
Test Description:
TMDS undershoot must below 25% of 2*VSWING. For compliance, the DUT should output the lowest supported pixel clock frequency during the test.
Test Limits:<=25%Undershoot (worst of 3)5.467Result Details:
Trial Summary
|
P/F
| Trial # | Actual Value | Margin | Test Frequency(MHz) | # Edges | Differential Swing Voltage(mV) | VH(mV) | VL(mV) | VH-(mV) | VH-(%) | VL+(mV) | VL+(%) |
 | Trial 1 | 5.467 | 78.1 | 148.347 | 1.000000k | 750.000 | 380.000 | -370.000 | 41.000 | 5.467 | 36.000 | 4.800 |
 | Trial 2 | 3.196 | 87.2 | 148.513 | 1.000000k | 751.000 | 380.000 | -371.000 | 24.000 | 3.196 | 23.000 | 3.063 |
 | Trial 3 | 3.453 | 86.2 | 148.391 | 1.000000k | 753.000 | 383.000 | -370.000 | 26.000 | 3.453 | 21.000 | 2.789 |
VH, VH+, VH-
Trial 1: VH, VH+, VH-
Trial 2: VH, VH+, VH-
Trial 3: VH, VH+, VH-
VL, VL+, VL-
Trial 1: VL, VL+, VL-
Trial 2: VL, VL+, VL-
Trial 3: VL, VL+, VL-
Test Summary:
Pass
Test Description:
TMDS overshoot must be below 15% of 2*VSWING. For compliance, the DUT should output the lowest supported pixel clock frequency during the test.
Test Limits:<=15%Overshoot (worst of 3)5.000Result Details:
Trial Summary